Probe System Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Probe System Product List

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[Rental] DC/AC Current Probe System

[Rental] DC/AC Current Probe System

A classic for current waveform analysis in switching circuits and more! Introducing a highly versatile current probe system.

At Yokogawa Rental & Lease, we offer the Tektronix 'DC/AC Current Probe System' consisting of four types of current probes and two types of amplifiers. All probes can be used from direct current, and there is no phase shift at low frequencies. The most sensitive probe, the "TCP302A," has a conversion sensitivity of 1mV/mA, allowing for high-sensitivity current measurements of 1mA/div with an oscilloscope voltage sensitivity of 1mV/div. 【Features】 ■ Composed of four types of current probes and two types of amplifiers ■ All probes can be used from direct current ■ No phase shift at low frequencies ■ Can be directly combined with many measuring instruments *For more details, please refer to the PDF document or feel free to contact us.

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E-Field Probe System EFS-105

E-Field Probe System EFS-105

It is now possible to accurately measure noise in semiconductors, high-density printed circuit boards, components, and modules, which have had many challenges in measurement methods until now.

Features: ★ 1D E-field probe ★ Ultra-small probe head ★ Fiber optic connection ★ Optical power supply – no battery required ★ Wide bandwidth: 500KHz to 3GHz ★ Dynamic range: typ. 130dB (1Hz) ★ Low noise: typ. <10μV/(m×√Hz) @ 200–500MHz typ. <30μV/(m×√Hz) @ 5MHz–3GHz

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200mm Manual Probe System 'WL-170'

200mm Manual Probe System 'WL-170'

Supports various on-wafer analysis measurement applications, Signatone probe system.

The WL-170 is a 200mm manual probe system that performs accurate RF, DC, IV-CV, and high-power test measurements with high reliability. It can be configured in multiple ways with chuck options, micropositioners for DC/RF/high power, microscopes, cameras, PCB holders, and more. Additionally, optional items such as equipment racks, vibration isolation tables, and thermal chucks are also available. *For more details, please download the PDF or feel free to contact us.

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150mm-200mm Manual Probe System 'WL-1160'

150mm-200mm Manual Probe System 'WL-1160'

High reliability and accurate RF/mmW, DC, IV-CV, high power test measurements Signatone probe system.

We offer the manual probe system 'WL-1160' equipped with a steel platen compatible with magnetic or vacuum suction, or fixed RF/DC/HP positioners, with a range of 150mm-200mm. With a robust design and multiple setup and configuration options, it can accommodate various applications. It is suitable for a wide range of RF/DC/HP testing. Additionally, quick movements and fine adjustments can be made with a one-handed XY stage knob. 【Example Configuration】 - Quick platen lift for platen separation adjustment, chuck fine rotation, and locking - Multiple configurations possible with chuck options, DC/RF/1-10KV micro positioners, microscopes, cameras, PCB holders, etc. - Instrument racks, vibration isolation tables, thermal chucks, dark boxes, etc. are also available (optional) *For more details, please download the PDF or feel free to contact us.

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Multi-probe system (exclusive option for 1600/2600FD)

Multi-probe system (exclusive option for 1600/2600FD)

Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.

This is an option that equips the underside operating axis of the APT-1600FD series with a dedicated fixture lifting mechanism. It allows for special inspections connected to external devices, such as Boundary Scan Testing (BST), as well as writing to and reading logs from ICs, to be performed in parallel with in-circuit testing. *Please refer to the YouTube video for an image of the operation.

  • Measurement and Inspection

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200mm Manual Probe System 'WL-170-THZ'

200mm Manual Probe System 'WL-170-THZ'

Signatone's probe system, recognized by the industry for its high reliability, supports various measurement applications.

We offer the Signatone 200mm manual probe system 'WL-170-THZ' equipped with a "large area positioner" on a widely reinforced platen. It is capable of RF/mmW, DC, IV-CV, and high-power test measurements. It supports various differential/broadband frequency extenders and automatic impedance tuners. With a robust design of extenders/tuners and seamless integration, it can accommodate a wide range of measurement applications. The system features easy operation, allowing for quick movements and fine adjustments with a one-handed XY stage knob. Additionally, the quick platen lift enables separation adjustment, chuck micro-rotation, and locking of the platen. Options include equipment racks, vibration isolation tables, and thermal chucks. Please feel free to consult us if you have any requests. *For more details, please download the PDF or feel free to contact us.

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200mm High Precision Manual Probe System 'WL-210-LE'

200mm High Precision Manual Probe System 'WL-210-LE'

Probe system by Signatone with local enclosure for accurate measurements.

We offer the high-reliability 200mm high-precision manual probe system 'WL-210-LE' with a local enclosure. It supports various applications such as failure analysis (FA), RF and mmW wafer-level reliability, and device characterization. The local enclosure is a high-performance environmental chamber that provides excellent EMI shielding and a light-tight environment, in addition to low noise, making it ideal for low-capacitance measurements. 【Features (e.g., Local Enclosure)】 ■ Advanced EMI/RFI/light shielding ■ Low leakage measurement (femtoamperes) ■ Operating temperature: -60°C to +300°C *For more details, please download the PDF or feel free to contact us.

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